Figure 2-8. Sequencer card A9 test functional diagram (sheet 5 of 5)

TM 9-4931-363-14&P

Figure 2-8. Sequencer card A9 test functional diagram (sheet 5 of 5)

(2) Refer to step 1 in figure 2-9 and in the logic card

Logic-card-A10 or logic-card-A15 foldout

(2)

test table. The logic card under test is connected to J8 on

schematic diagram from TM 9-1270-212-14&P

the test set. Setting S4 to position 6 and S8 to position 1

connects 28 volts dc through wiper 1 and contact 7 of S4-A

(3) Logic card A10/A15 test functional diagram (fig.

and through wiper 1 and contact 2 of S8-A to J8-6 and -18.

2-9).

The test set provides a 28-volt return at J8-12. The 5 volts

dc is connected to J8-1 through wiper 1 and contact 2 of

NOTE

S8-F. The test set provides a signal return at J8-4. The -6

volts dc is connected to J8-16 through wiper 1 and contact

TM 9-1270-212-14&P information on logic card

2 of S8-H. Connector J8 in the test set connects J8-25 to

A15 differs basically only in that it has two

J8-37. Pressing S11 connects 28 volts dc through S11,

additional steps.

through wiper 1 and contact 7 of S4-B, through wiper 1

and contact 2 of S8-E to J8-9, the BIT initiate input. The

(1) To prepare for the logic card test theory

28 volts is connected from contact 2 of S8-E to energize

discussion, refer to the troubleshooting procedures for the

K8. Energized K8 applies a ground to J8-24. The 28 volts is

applicable logic card (A10 or A15) in TM 9-1270-212-14&P

also connected from contact 2 of S8-E through CR15 to

and mentally perform steps a through e .

2-44