Quantcast Figure 2-9. Logic card A10/A15 test functional diagram (sheet 9 of 9)

 

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Figure 2-9. Logic card A10/A15 test functional diagram (sheet 8 of 9)
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TM-9-4931-363-14-P Fire Control Subsystem Test Set AN/GSM-249 P/N 2201736-05 Manual
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Figure 2-10. Comparator card A11 test functional diagram
TM 9-4931-363-14&P
Figure 2-9. Logic card A10/A15 test functional diagram (sheet 9 of 9)
for comparator card A11 in TM 9-1270-212-14&P and
2-16. Comparator Card A11 Test Theory.
mentally perform steps a through c.
a. Reference Material. The following reference
materials are required to support the comparator card Al1
test theory discussion:
(2) Refer to figure 2-10 and step d of the A11
troubleshooting procedure, The A11 comparator card
( 1 ) Comparator card Al1 troubleshooting
under test is connected to J9 on the test set. The 28 volts
procedures from TM 9-1270-212-14&P
dc is connected through wiper 1 and contact 7 of S4-A,
through wiper 1 and contact 5 of S8-A, and through CR23
(2) Comparator- card Al1 foldout schematic diagram
to energize K4. The energized K4 connects three voltages to
from TM 9-1270-212-14&P
the card that represents a particular linkage position.
Reference voltage V8 (paragraph 4-8c and table 4-5) from
(3) Comparator card A11 test functional diagram
the wiper of R8 is connected through contacts 4 and 3 of
K4 to J9-38. Reference voltage V5 from the wiper of R7 is
connected through contacts 7 and 6 of K4 to J9-40.
b. Theory Discussion
Reference voltage V9 from the wiper of R10 is connected
through contacts 10 and 9 of K4 to R9-39. Two voltages
(1) To prepare for the comparator card Al1 test
that represent normal outputs from the test resolver when a
theory discussion, refer to the troubleshooting procedures
buffer amplifier is under test are connected to the card.

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