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Page Title: Appendix C. QUALITY ASSURANCE INSPECTION INSTRUCTIONS OPTICAL MATERIAL-PRESSURIZED ITEMS
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SB 74-95-700
TRC 5OP
APPENDIX C
QUALITY ASSURANCE INSPECTION INSTRUCTIONS
OPTICAL MATERIAL-PRESSURIZED ITEMS
TRC-50P
Section Numbers) (Single Sampling
C-1.
Purpose.
The purpose of this inspection
Plan). MILSTD-105.
instruction is to provide necessary information and
(3) Select, in a random manner, a sample from
procedures for inspection of Armament Fire Control
the lot of Items.
Materiel which either contains optics or are optical in
(4) Visually inspect the packaging of each
nature and/or which may be pressurized with a dry
sample item for defects cited in section II and appendix
nitrogen atmosphere.
(5) Remove packaging.
C-2. Policy. These inspection instructions have been
(6) Visually inspect each sample item for the
designed to detect any significant deterioration of
defects cited in appendix A.
materiel in storage and to avoid over inspection.
(7) The requirements herein shall apply to visual
inspection of optics or materiel containing optics or to
C-3.  Instruction.  For purposes of this inspection
items that are pressurized; while in storage.  The
instruction, applicable materiel is identified in appendix A
technique of shading will not be used except for
and cites the TRC of this appendix as supplementary
detecting moisture.  In case of deviation between the
inspection instructions. Inspect each item for the defects
following and the item technical data package (TDP), or
listed in appendix A and for the instructions in this
an applicable technical manual (TM), the TDP or the TM
appendix instruction.
shall take precedent (Refer to MIL-STD-124 for definition
a. References.
of terms).
(1).
TM 750-116 General Procedures for
(8) Items found acceptable shall be replaced to
Purging and Charging of Fire Control Instruments
their original configuration and returned to storage.
(2). NSN 4931-00-065-1110 Purging Kit
(9) A defective item will remain defective until it
(3).  NSN 4931-00-065-1110 Fixture Pressure
is repaired or replaced.
Test
(10) Samples with major defects or samples
b. Inspection Conditions.
which cannot be returned to their original package
(1) Inspection Lot: An inspection lot is defined as
configuration shall be segregated and reported for
all items having the same level of packaging and year of
disposition instructions.
manufacture, rebuild or modification.
(2) Inspection frequency: Inspection frequency
C-4. Inspection Procedure.
shall be as prescribed in appendix B or as determined by
a. Optical Material.
other sources.
(1) Moisture or condensation. There will be no
(3) Inspection lot disposition criteria:
evidence of moisture, condensation, or staining resulting
(a) Accept lot. Accept in accordance with d
from moisture on optical elements.  Should such a
below.
condition exist classify the item as a major defective.
(b) Reject lot.  Reject in accordance with d
Some items contain dry nitrogen gas under a slight
below.
pressure to keep moisture out and avoid oxidation. If the
c. Defect Classification.
item has purging and charging ports, the item will be
(1) The failure of any one of the applicable visual
purged and charged with dry nitrogen using NSN 4931-
inspections or the pressurization test specified below
00-065-1110 as specified in TM 750-116, General
shall be considered a major defect.
Procedures for Purging and Charging of Fire Control
(2) The failure of any quality defect code (QDC) in
Instruments (see C-4.(b)).
appendix A shall be considered a defect to the level
(2) Fracture. No fractures will be allowed on any
indicated by the QDC, critical, major or minor.
surface optical element.  Should damage be found
d. Inspection Methods.
classify the item as a major defective.
(1) For a lot of Items, Inspection Level (IL) S-3
(3) Smears or fingerprints.  There shall be no
applies.  See table 2-1, (Master Sampling Plan) MIL-
evidence of any smears or fingerprints on optical
STD-105.
surfaces. Should such a condition exist classify the item
(2) For a lot of Items, the following Acceptable
as a minor defective.
Quality Levels (AQL's) apply:
(4) Chips.  The presence of chips on optics
Majors  Minors
between the reticle and the objective end of the
0.65
4.0 See Table 2-2, (Acceptance and Re-
instrument
C-1

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